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硒化物晶体

  • 二硒化钨晶体(99.995%) WSe2(Tungsten Diselenide)-P型
  • 二硒化钨晶体(99.995%) WSe2(Tungsten Diselenide)-P型
  • 二硒化钨晶体(99.995%) WSe2(Tungsten Diselenide)-P型
  • 二硒化钨晶体(99.995%) WSe2(Tungsten Diselenide)-P型
  • 二硒化钨晶体(99.995%) WSe2(Tungsten Diselenide)-P型
二硒化钨晶体(99.995%) WSe2(Tungsten Diselenide)-P型二硒化钨晶体(99.995%) WSe2(Tungsten Diselenide)-P型二硒化钨晶体(99.995%) WSe2(Tungsten Diselenide)-P型二硒化钨晶体(99.995%) WSe2(Tungsten Diselenide)-P型二硒化钨晶体(99.995%) WSe2(Tungsten Diselenide)-P型

二硒化钨晶体(99.995%) WSe2(Tungsten Diselenide)-P型

二硒化钨晶体 WSe2(Tungsten Diselenide)-P型
晶体尺寸:~10毫米
电学性能:半导体,P型
晶体结构:六边形
晶胞参数:a = b = 0.328 nm, c = 1.298 nm, α = β = 90°, γ = 120°
晶体类型:合成
晶体纯度:>99.995%


X-ray diffraction on a WSe2 single crystal aligned along the (001) plane. XRD was performed at room temperature using a D8 Venture Bruker. The 5 XRD peaks correspond, from left to right, to (00l) with l = 2, 4, 6, 8, 10


Powder X-ray diffraction (XRD) of a single crystal WSe2. X-ray diffraction was performed at room temperature using a D8 Venture Bruker.


Stoichiometric analysis of a single crystal WSe2 by Energy-dispersive X-ray spectroscopy (EDX).


Raman spectrum of a single crystal WSe2. Measurement was performed with a 785 nm Raman system at room temperature.

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